Polycrystalline materials analysis using the Maia pixelated...

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Polycrystalline materials analysis using the Maia pixelated energy-dispersive X-ray area detector

Kirkwood, Henry J, de Jonge, Martin D, Howard, Daryl L, Ryan, Chris G, van Riessen, Grant, Hofmann, Felix, Rowles, Matthew R, Paradowska, Anna M, Abbey, Brian
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Language:
english
Journal:
Powder Diffraction
DOI:
10.1017/S0885715617000768
Date:
September, 2017
File:
PDF, 321 KB
english, 2017
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