Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures
2015 / 09 Vol. 33; Iss. 5
Thickness-dependent mobility in tetracene thin-film field-effect-transistors
Shi, Jun, Jiang, De-Tong, Dutcher, John R., Qin, Xiao-RongVolume:
33
Language:
english
Journal:
Journal of Vacuum Science & Technology B, Nanotechnology and Microelectronics: Materials, Processing, Measurement, and Phenomena
DOI:
10.1116/1.4931034
Date:
September, 2015
File:
PDF, 1.08 MB
english, 2015