Bias and illumination instability analysis of...

Thin Solid Films 2017 / 9

Bias and illumination instability analysis of solution-processed a-InGaZnO thin-film transistors with different component ratios

Kim, Ji-Hwan, Park, Eung-Kyu, Kim, Min Su, Cho, Hyeong Jun, Lee, Dong-Hoon, Kim, Jin-Ho, Khang, Yoonho, Park, KeeChan, Kim, Yong-Sang
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Language:
english
Journal:
Thin Solid Films
DOI:
10.1016/j.tsf.2017.09.054
Date:
September, 2017
File:
PDF, 1.38 MB
english, 2017
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