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Optics and Lasers in Engineering 2017 / 10

Integrating image processing and classification technology into automated polarizing film defect inspection

Kuo, Chung-Feng Jeffrey, Lai, Chun-Yu, Kao, Chih-Hsiang, Chiu, Chin-Hsun
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Language:
english
Journal:
Optics and Lasers in Engineering
DOI:
10.1016/j.optlaseng.2017.09.017
Date:
October, 2017
File:
PDF, 3.95 MB
english, 2017
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