Defect Microstructure in Irradiated Silicon Carbide
Kondo, Sosuke, Katoh, Yutai, Snead, Lance L., Hinoki, TatsuyaVolume:
21
Language:
english
Journal:
Microscopy and Microanalysis
DOI:
10.1017/S1431927615007448
Date:
August, 2015
File:
PDF, 113 KB
english, 2015