Structural and electrical properties of In-implanted Ge
Feng, R., Kremer, F., Sprouster, D. J., Mirzaei, S., Decoster, S., Glover, C. J., Medling, S. A., Russo, S. P., Ridgway, M. C.Volume:
118
Language:
english
Journal:
Journal of Applied Physics
DOI:
10.1063/1.4934200
Date:
October, 2015
File:
PDF, 1.99 MB
english, 2015