Comparative analysis of methods for measurement of the...

Comparative analysis of methods for measurement of the surface potential of dielectrics charging under electron-beam irradiation in a scanning electron microscope

Rau, E. I., Tatarintsev, A. A., Kupreenko, S. Yu., Zaitsev, S. V., Podbutsky, N. G.
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Volume:
11
Language:
english
Journal:
Journal of Surface Investigation: X-ray, Synchrotron and Neutron Techniques
DOI:
10.1134/S1027451017050354
Date:
September, 2017
File:
PDF, 688 KB
english, 2017
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