Plagiarism analysis, authorship identification, and near-duplicate detection PAN'07
Stein, Benno, Koppel, Moshe, Stamatatos, EfstathiosVolume:
41
Language:
english
Journal:
ACM SIGIR Forum
DOI:
10.1145/1328964.1328976
Date:
December, 2007
File:
PDF, 111 KB
english, 2007