Point Contact Current Voltage Measurements of 4H-SiC...

Materials Science Forum 2017 / 5 Vol. 897

Point Contact Current Voltage Measurements of 4H-SiC Samples with Different Doping Profiles

Kocher, Matthias, Niebauer, Michael, Rommel, Mathias, Haeublein, Volker, Bauer, Anton J.
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Volume:
897
Language:
english
Journal:
Materials Science Forum
DOI:
10.4028/www.scientific.net/msf.897.287
Date:
May, 2017
File:
PDF, 1.59 MB
english, 2017
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