Ultrafast RESET Analysis of HfO...

Advanced Electronic Materials 2017 / 10

Ultrafast RESET Analysis of HfO x -Based RRAM by Sub-Nanosecond Pulses

Wang, Chen, Wu, Huaqiang, Gao, Bin, Wu, Wei, Dai, Lingjun, Li, Xinyi, Qian, He
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Language:
english
Journal:
Advanced Electronic Materials
DOI:
10.1002/aelm.201700263
Date:
October, 2017
File:
PDF, 2.17 MB
english, 2017
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