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Effect of interstitial impurities on the field dependent microwave surface resistance of niobium
Martinello, M., Grassellino, A., Checchin, M., Romanenko, A., Melnychuk, O., Sergatskov, D. A., Posen, S., Zasadzinski, J. F.Volume:
109
Language:
english
Journal:
Applied Physics Letters
DOI:
10.1063/1.4960801
Date:
August, 2016
File:
PDF, 647 KB
english, 2016