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Deformation mapping in the TEM by dark holography, nanobeam diffraction, geometrical phase analysis and precession electron diffraction. A comparison of the different techniques
Cooper, David, Bernier, Nicolas, Rouviere, Jean-LucVolume:
71
Journal:
Acta Crystallographica Section A Foundations and Advances
DOI:
10.1107/s2053273315098502
Date:
August, 2015
File:
PDF, 887 KB
2015