SIMS on the Helium Ion Microscope: a Powerful Tool for...

Microscopy and Microanalysis 2016 / 07 Vol. 22; Iss. S3

SIMS on the Helium Ion Microscope: a Powerful Tool for High-Resolution High-Sensitivity Nano-Analytics

Wirtz, Tom, Dowsett, David, Audinot, Jean-Nicolas, Eswara, Santhana
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Volume:
22
Language:
english
Journal:
Microscopy and Microanalysis
DOI:
10.1017/s1431927616001653
Date:
July, 2016
File:
PDF, 217 KB
english, 2016
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