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measured by resonant inelastic x-ray scattering
Fatale, S., Fatuzzo, C. G., Babkevich, P., Shaik, N. E., Pelliciari, J., Lu, X., McNally, D. E., Schmitt, T., Kikkawa, A., Taguchi, Y., Tokura, Y., Normand, B., Rønnow, H. M., Grioni, M.Volume:
96
Language:
english
Journal:
Physical Review B
DOI:
10.1103/PhysRevB.96.115149
Date:
September, 2017
File:
PDF, 1.68 MB
english, 2017