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[IEEE 2017 IEEE Electron Devices Technology and Manufacturing Conference (EDTM) - Toyama (2017.2.28-2017.3.2)] 2017 IEEE Electron Devices Technology and Manufacturing Conference (EDTM) - Modeling and analysis of depletion-mode NMOS transistor as transmitter/receiver RF switch
Ning, Runtao, Liu, Tianjiao, Shen, Z. JohnYear:
2017
Language:
english
DOI:
10.1109/EDTM.2017.8000254
File:
PDF, 725 KB
english, 2017