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Interferometric method for quantitatively testing the RadOptic effect in bulk semiconductors
Peng, Bo-dong, Song, Yan, Hei, Dong-wei, Zhao, JunVolume:
88
Language:
english
Journal:
Review of Scientific Instruments
DOI:
10.1063/1.5005171
Date:
October, 2017
File:
PDF, 575 KB
english, 2017