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Application research on the sensitivity of porous silicon
Xu, Gaobin, Xi, Ye, Chen, Xing, Ma, YuanmingVolume:
38
Language:
english
Journal:
Journal of Semiconductors
DOI:
10.1088/1674-4926/38/9/094003
Date:
September, 2017
File:
PDF, 7.94 MB
english, 2017