Defect-induced excitonic recombination in Ti...

Japanese Journal of Applied Physics 2017 / 11 Vol. 56; Iss. 11

Defect-induced excitonic recombination in Ti x Zn 1− x O thin films grown by DC-unbalanced magnetron sputtering

Nurfani, Eka, Kurniawan, Robi, Aono, Takashige, Takeda, Kohei, Shirai, Yuma, Sutjahja, Inge M., Rusydi, Andrivo, Winata, Toto, Takase, Kouichi, Darma, Yudi
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Volume:
56
Language:
english
Journal:
Japanese Journal of Applied Physics
DOI:
10.7567/JJAP.56.112101
Date:
November, 2017
File:
PDF, 1.93 MB
english, 2017
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