In situ wavelength calibration of the edge CXS spectrometers on JET
Delabie, E., Hawkes, N., Biewer, T. M., O’Mullane, M. G.Volume:
87
Language:
english
Journal:
Review of Scientific Instruments
DOI:
10.1063/1.4960306
Date:
November, 2016
File:
PDF, 763 KB
english, 2016