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In situ wavelength calibration of the edge CXS...

In situ wavelength calibration of the edge CXS spectrometers on JET

Delabie, E., Hawkes, N., Biewer, T. M., O’Mullane, M. G.
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Volume:
87
Language:
english
Journal:
Review of Scientific Instruments
DOI:
10.1063/1.4960306
Date:
November, 2016
File:
PDF, 763 KB
english, 2016
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