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Use of a novel infrared wavelength-tunable laser Mueller-matrix polarimetric scatterometer to measure nanostructured optical materials
Vap, Jason C., Nauyoks, Stephen E., Benson, Michael R., Marciniak, Michael A.Volume:
88
Language:
english
Journal:
Review of Scientific Instruments
DOI:
10.1063/1.4990003
Date:
October, 2017
File:
PDF, 9.42 MB
english, 2017