Zein film functionalized atomic force microscopy and Raman...

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Zein film functionalized atomic force microscopy and Raman spectroscopic evaluations on surface differences between hard and soft wheat flour

Kwek, Jin W., Siliveru, Kaliramesh, Cheng, Shuying, Xu, Qisong, Ambrose, R.P.Kingsly
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Language:
english
Journal:
Journal of Cereal Science
DOI:
10.1016/j.jcs.2017.09.012
Date:
October, 2017
File:
PDF, 1.55 MB
english, 2017
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