Zein film functionalized atomic force microscopy and Raman spectroscopic evaluations on surface differences between hard and soft wheat flour
Kwek, Jin W., Siliveru, Kaliramesh, Cheng, Shuying, Xu, Qisong, Ambrose, R.P.KingslyLanguage:
english
Journal:
Journal of Cereal Science
DOI:
10.1016/j.jcs.2017.09.012
Date:
October, 2017
File:
PDF, 1.55 MB
english, 2017