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An InAs/high-k/low-k structure: Electron transport and interface analysis
Ui, Toshimasa, Mori, Ryousuke, Le, Son Phuong, Oshima, Yoshifumi, Suzuki, Toshi-kazuVolume:
7
Language:
english
Journal:
AIP Advances
DOI:
10.1063/1.4983176
Date:
May, 2017
File:
PDF, 6.13 MB
english, 2017