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Noise tolerant probabilistic logic for statistical pattern recognition applications
Canals, V., Frasser, C.F., Alomar, M.L., Morro, A., Oliver, A., Roca, M., Isern, E., Martínez-Moll, V., Garcia-Moreno, E., Rosselló, J.L.Volume:
24
Language:
english
Journal:
Integrated Computer-Aided Engineering
DOI:
10.3233/ICA-170549
Date:
September, 2017
File:
PDF, 13.12 MB
english, 2017