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50 keV H + ion beam irradiation of Al doped ZnO thin films: Studies of radiation stability for device applications
Sahoo, Susanta Kumar, Mangal, Sutanu, Mishra, D.K., Singh, Udai P., Kumar, PravinLanguage:
english
Journal:
Surface and Interface Analysis
DOI:
10.1002/sia.6328
Date:
October, 2017
File:
PDF, 600 KB
english, 2017