Design of 2.4-GHz T/R switch with embedded ESD protection...

Microelectronics Reliability 2017 / 11 Vol. 78

Design of 2.4-GHz T/R switch with embedded ESD protection devices in CMOS process

Lin, Chun-Yu, Liu, Rui-Hong, Ker, Ming-Dou
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Volume:
78
Language:
english
Journal:
Microelectronics Reliability
DOI:
10.1016/j.microrel.2017.09.005
Date:
November, 2017
File:
PDF, 2.33 MB
english, 2017
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