Interface traps effect on the charge transport mechanisms...

Microelectronics Reliability 2017 / 11 Vol. 78

Interface traps effect on the charge transport mechanisms in metal oxide semiconductor structures based on silicon nanocrystals

Chatbouri, S., Troudi, M., Kalboussi, A., Souifi, A.
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Volume:
78
Language:
english
Journal:
Microelectronics Reliability
DOI:
10.1016/j.microrel.2017.09.010
Date:
November, 2017
File:
PDF, 1.01 MB
english, 2017
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