Improved scatter correction with factor analysis for planar and SPECT imaging
Knoll, Peter, Rahmim, Arman, Gültekin, Selma, Šámal, Martin, Ljungberg, Michael, Mirzaei, Siroos, Segars, Paul, Szczupak, BoguslawVolume:
88
Language:
english
Journal:
Review of Scientific Instruments
DOI:
10.1063/1.5001024
Date:
September, 2017
File:
PDF, 10.39 MB
english, 2017