Characterization and optimization of a thin direct electron detector for fast imaging applications
Dourki, I., Westermeier, F., Schopper, F., Richter, R.H., Andricek, L., Ninkovic, J., Treis, J., Koffmane, C., Wassatsch, A., Peric, I., Epp, S.W., Miller, R.J.D.Volume:
12
Language:
english
Journal:
Journal of Instrumentation
DOI:
10.1088/1748-0221/12/03/C03047
Date:
March, 2017
File:
PDF, 2.29 MB
english, 2017