Trapping phenomena and degradation mechanisms in GaN-based...

  • Main
  • 2017 / 10
  • Trapping phenomena and degradation mechanisms in GaN-based...
Materials Science in Semiconductor Processing 2017 / 10

Trapping phenomena and degradation mechanisms in GaN-based power HEMTs

Meneghini, Matteo, Tajalli, Alaleh, Moens, Peter, Banerjee, Abhishek, Zanoni, Enrico, Meneghesso, Gaudenzio
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Language:
english
Journal:
Materials Science in Semiconductor Processing
DOI:
10.1016/j.mssp.2017.10.009
Date:
October, 2017
File:
PDF, 2.80 MB
english, 2017
Conversion to is in progress
Conversion to is failed