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Dielectric Breakdown in Chemical Vapor Deposited Hexagonal Boron Nitride
Jiang, Lanlan, Shi, Yuanyuan, Hui, Fei, Tang, Kechao, Wu, Qian, Pan, Chengbin, Jing, Xu, Uppal, Hasan J, Palumbo, Felix Roberto Mario, Lu, Guangyuan, Wu, Tianru, Wang, Haomin, Villena, Marco A., Xie,Language:
english
Journal:
ACS Applied Materials & Interfaces
DOI:
10.1021/acsami.7b10948
Date:
October, 2017
File:
PDF, 1.53 MB
english, 2017