Scanning Kelvin Probe Microscopy investigation of the contact resistances and charge mobility in n-type PDIF-CN 2 thin-film transistors
Chianese, Federico, Chiarella, Fabio, Barra, Mario, Carella, Antonio, Cassinese, AntonioLanguage:
english
Journal:
Organic Electronics
DOI:
10.1016/j.orgel.2017.10.021
Date:
October, 2017
File:
PDF, 19.41 MB
english, 2017