Probabilistic fatigue damage estimation of embedded...

Microelectronics Reliability 2017 / 11 Vol. 78

Probabilistic fatigue damage estimation of embedded electronic solder joints under random vibration

Jannoun, Mayssam, Aoues, Younes, Pagnacco, Emmanuel, Pougnet, Philippe, El-Hami, Abdelkhalak
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Volume:
78
Language:
english
Journal:
Microelectronics Reliability
DOI:
10.1016/j.microrel.2017.08.005
Date:
November, 2017
File:
PDF, 1.66 MB
english, 2017
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