On the origin of dynamic R on in commercial GaN-on-Si...

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Microelectronics Reliability 2017 / 10

On the origin of dynamic R on in commercial GaN-on-Si HEMTs

Karboyan, Serge, Uren, Michael J., Manikant,, Pomeroy, James W., Kuball, Martin
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Language:
english
Journal:
Microelectronics Reliability
DOI:
10.1016/j.microrel.2017.10.006
Date:
October, 2017
File:
PDF, 948 KB
english, 2017
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