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Effect of Oxide Thickness Variation in Sub-micron NMOS Transistor
Radzi, N Mohd, Sanudin, RVolume:
226
Language:
english
Journal:
IOP Conference Series: Materials Science and Engineering
DOI:
10.1088/1757-899X/226/1/012145
Date:
August, 2017
File:
PDF, 772 KB
english, 2017