[IEEE 2016 IEEE Applied Imagery Pattern Recognition Workshop (AIPR) - Washington, DC, USA (2016.10.18-2016.10.20)] 2016 IEEE Applied Imagery Pattern Recognition Workshop (AIPR) - Seismic signal analysis using multi-scale/multi-resolution transformations
Thomas, Millicent, Raquepas, Joseph, Lutz, Adam, Ezekiel, SoundararajanYear:
2016
Language:
english
DOI:
10.1109/AIPR.2016.8010599
File:
PDF, 488 KB
english, 2016