[IEEE 2016 IEEE Applied Imagery Pattern Recognition...

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[IEEE 2016 IEEE Applied Imagery Pattern Recognition Workshop (AIPR) - Washington, DC, USA (2016.10.18-2016.10.20)] 2016 IEEE Applied Imagery Pattern Recognition Workshop (AIPR) - Seismic signal analysis using multi-scale/multi-resolution transformations

Thomas, Millicent, Raquepas, Joseph, Lutz, Adam, Ezekiel, Soundararajan
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Year:
2016
Language:
english
DOI:
10.1109/AIPR.2016.8010599
File:
PDF, 488 KB
english, 2016
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