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[IEEE 2017 75th Device Research Conference (DRC) - South Bend, IN, USA (2017.6.25-2017.6.28)] 2017 75th Annual Device Research Conference (DRC) - Narrow line crystallization of rubrene thin film enhanced by Yb interfacial layer for single crystal OFET application
Ohmi, Shun-ichiro, Hiroki, Mizuha, Maeda, YasutakaYear:
2017
Language:
english
DOI:
10.1109/drc.2017.7999464
File:
PDF, 293 KB
english, 2017