Evaluation and mitigation of performance degradation under...

Evaluation and mitigation of performance degradation under random telegraph noise for digital circuits

Luo, Hong, Chen, Xiaoming, Xie, Yuan, Cao, Yu, Yang, Huazhong, Ma, Yuchun, Wang, Yu
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Volume:
7
Language:
english
Journal:
IET Circuits, Devices & Systems
DOI:
10.1049/iet-cds.2012.0361
Date:
September, 2013
File:
PDF, 529 KB
english, 2013
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