Evaluation and mitigation of performance degradation under random telegraph noise for digital circuits
Luo, Hong, Chen, Xiaoming, Xie, Yuan, Cao, Yu, Yang, Huazhong, Ma, Yuchun, Wang, YuVolume:
7
Language:
english
Journal:
IET Circuits, Devices & Systems
DOI:
10.1049/iet-cds.2012.0361
Date:
September, 2013
File:
PDF, 529 KB
english, 2013