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A Wavelet-based AFM Fast Imaging Method with Self-Tuning Scanning Frequency
Wu, Yinan, Fang, Yongchun, Ren, Xiao, Lu, HanYear:
2017
Language:
english
Journal:
IEEE Transactions on Nanotechnology
DOI:
10.1109/tnano.2017.2761810
File:
PDF, 1.07 MB
english, 2017