(Invited) Investigation of Critical Interfaces in Few-Layer...

ECS Transactions 2017 / 08 Vol. 80; Iss. 1

(Invited) Investigation of Critical Interfaces in Few-Layer MoS 2 Field Effect Transistors with High-k Dielectrics

Young, Chadwin D, Bolshakov, P., Zhao, P., Smyth, C., Khosravi, A., Hurley, P. K., Hinkle, Christopher L, Wallace, Robert M
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Volume:
80
Language:
english
Journal:
ECS Transactions
DOI:
10.1149/08001.0219ecst
Date:
August, 2017
File:
PDF, 395 KB
english, 2017
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