![](/img/cover-not-exists.png)
AIP Conference Proceedings [AIP PHYSICS OF SEMICONDUCTORS: 30th International Conference on the Physics of Semiconductors - Seoul, (Korea) (25–30 July 2010)] - The influence of the SiO[sub 2] interlayer on transfer characteristic in tin oxide thin film transistor
Kim, Woong-Sun, Moon, Yeon-Keon, Kim, Kyung-Taek, Park, Jong-Wan, Ihm, Jisoon, Cheong, HyeonsikYear:
2011
Language:
english
DOI:
10.1063/1.3666324
File:
PDF, 186 KB
english, 2011