![](/img/cover-not-exists.png)
Reflection electron energy loss spectroscopy of structures based on silicon and transition metals
Parshin, A S, Igumenov, A Yu, Mikhlin, Yu L, Pchelyakov, O P, Zhigalov, V SVolume:
255
Language:
english
Journal:
IOP Conference Series: Materials Science and Engineering
DOI:
10.1088/1757-899X/255/1/012019
Date:
October, 2017
File:
PDF, 403 KB
english, 2017