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Signal distortion in atomic force microscopy photodetector
Eppell, Steven J., Feinstein, Matthew, Li, Li, White, Brandon, Zypman, Fredy R.Volume:
88
Language:
english
Journal:
Review of Scientific Instruments
DOI:
10.1063/1.5008833
Date:
October, 2017
File:
PDF, 2.98 MB
english, 2017