[IEEE 2017 Devices for Integrated Circuit (DevIC) -...

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[IEEE 2017 Devices for Integrated Circuit (DevIC) - Kalyani, India (2017.3.23-2017.3.24)] 2017 Devices for Integrated Circuit (DevIC) - Performance analysis and comparative study of high-K triple metal double gate SON TFET with SOI equivalent

Kumari, Tripty, Sarkar, Subir Kumar
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Year:
2017
Language:
english
DOI:
10.1109/DEVIC.2017.8073927
File:
PDF, 701 KB
english, 2017
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