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[IEEE 2017 XX IEEE International Conference on Soft Computing and Measurements (SCM) - Saint Petersburg, Russia (2017.5.24-2017.5.26)] 2017 XX IEEE International Conference on Soft Computing and Measurements (SCM) - Built identifier for the control circuit subject
Legotkina, T. S., Antineskul, A. V., Gorozhankin, A. I.Year:
2017
Language:
english
DOI:
10.1109/scm.2017.7970647
File:
PDF, 200 KB
english, 2017