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Effect of residual chips on the material removal process of the bulk metallic glass studied by in situ scratch testing inside the scanning electron microscope
Huang, Hu, Zhao, Hongwei, Shi, Chengli, Wu, Boda, Fan, Zunqiang, Wan, Shunguang, Geng, ChunyangVolume:
2
Language:
english
Journal:
AIP Advances
DOI:
10.1063/1.4774032
Date:
December, 2012
File:
PDF, 1.07 MB
english, 2012