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[ACM Press the - Banff, Alberta, Canada (2017.05.10-2017.05.12)] Proceedings of the on Great Lakes Symposium on VLSI 2017 - GLSVLSI '17 - Mitigating the Effect of Reliability Soft-errors of RRAM Devices on the Performance of RRAM-based Neuromorphic Systems
Tosson, Amr M.S., Yu, Shimeng, Anis, Mohab, Wei, LanYear:
2017
Language:
english
DOI:
10.1145/3060403.3060431
File:
PDF, 5.08 MB
english, 2017