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[American Institute of Aeronautics and Astronautics AIAA Modeling and Simulation Technologies Conference and Exhibit - Montreal,Canada (06 August 2001 - 09 August 2001)] AIAA Modeling and Simulation Technologies Conference and Exhibit - Runway texture and grid pattern effects on rate-of-descent perception
Schroeder, Jeffrey, Sweet, Barbara, Dearing, Munro, Atenci, Adolph, Kaiser, MaryLanguage:
english
DOI:
10.2514/6.2001-4307
File:
PDF, 984 KB
english