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EXPRESS: A newly designed infrared reflection absorption spectroscopy system for in situ characterization from ultrahigh vacuum to ambient pressure
Du, Yunshu, Li, Ling, Wang, Xuan, Qiu, HengshanLanguage:
english
Journal:
Applied Spectroscopy
DOI:
10.1177/0003702817742053
Date:
October, 2017
File:
PDF, 673 KB
english, 2017