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Impact of line edge roughness on the performance of 14-nm FinFET: Device-circuit Co-design
Rathore, Rituraj Singh, Rana, Ashwani K.Language:
english
Journal:
Superlattices and Microstructures
DOI:
10.1016/j.spmi.2017.10.038
Date:
November, 2017
File:
PDF, 2.36 MB
english, 2017