Band alignment of SiO 2 /(Al x Ga 1-x ) 2 O 3 (0 ≤ x ≤...

Applied Surface Science 2018 / 03 Vol. 434

Band alignment of SiO 2 /(Al x Ga 1-x ) 2 O 3 (0 ≤ x ≤ 0.49) determined by X-ray photoelectron spectroscopy

Feng, Zhaoqing, Feng, Qian, Zhang, Jincheng, Li, Xiang, Li, Fuguo, Huang, Lu, Chen, Hong-Yan, Lu, Hong-Liang, Hao, Yue
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Volume:
434
Language:
english
Journal:
Applied Surface Science
DOI:
10.1016/j.apsusc.2017.10.156
Date:
March, 2018
File:
PDF, 2.36 MB
english, 2018
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